Interaction Between Oxygen and Single Self-Interstitials in Silicon

AuthID
 P-000-E1T
4
Author(s)
Pinho, N
·
1
Editor(s)
Bonde Nielsen K.Nylandsted Larsen A.Weyer G.
Document Type
Article
Year published
2003
Published
in PHYSICA B-CONDENSED MATTER, ISSN: 0921-4526
Volume: 340, Pages: 575-577 (3)
Conference
22Nd International Conference on Defects in Semiconductors (Icds-22), Date: JUL 28-AUG 01, 2003, Location: AARHUS, DENMARK, Host: UNIV AARHUS
Indexing
Wos®
Scopus®
Crossref®5
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0347764771
Wos: WOS:000188300200117
Source Identifiers
ISSN: 0921-4526
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service