Low Incident Angle and Classical X-Ray Diffraction Analysis of Residual Stresses in Diamond Coated Si3N4

AuthID
P-000-EM7
3
Author(s)
Belmonte, M
·
Document Type
Article
Year published
2003
Published
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 94, Issue: 9, Pages: 5633-5638 (6)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0242580777
Wos: WOS:000186138600025
Source Identifiers
ISSN: 0021-8979
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.