On-Line Measurement of Yarn Evenness

AuthID
 P-000-KV8
5
Author(s)
Pinto, JG
·
Monteiro, J
·
Document Type
Proceedings Paper
Year published
2003
Published
in 2003 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1 AND 2
Pages: 1059-1064 (6)
Conference
Ieee International Symposium on Industrial Electronics, Date: JUN 09-11, 2003, Location: RIO DE JANEIRO, BRAZIL, Sponsors: IEEE, ies, SICE, Coppe UFRJ
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Wos: WOS:000188940100162
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