Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Combined Analyses of Ion Beam Synthesized Layers in Porous Silicon
AuthID
P-000-SSH
8
Author(s)
Ramos, AR
·
Paszti, F
·
Horvath, ZE
·
Vazsonyi, E
·
Conde, O
·
da Silva, MF
·
da Silva, MR
·
Soares, JC
1
Editor(s)
Kwiatek W.M.Marszalek M.
Document Type
Article
Year published
2001
Published
in
ACTA PHYSICA POLONICA A,
ISSN: 0587-4246
Volume: 100, Issue: 5, Pages: 773-780 (8)
Conference
36Th Zahopane School of Physics International Symosium on Condensed Matter Studies with Nuclear Methods,
Date:
MAY 14-19, 2001,
Location:
ZAKOPANE, POLAND
Indexing
Wos
®
Scopus
®
Metadata
Sources
Publication Identifiers
SCOPUS
: 2-s2.0-33744547339
Wos
: WOS:000172729900021
Source Identifiers
ISSN
: 0587-4246
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service