Ion Microprobe Study of the Scale Formed During High Temperature Oxidation of High Silicon En-1.4301 Stainless Steel

AuthID
 P-000-V4B
6
Author(s)
Paul, A
·
Elmrabet, S
·
da Silva, MF
·
Soares, JC
·
Odriozola, JA
1
Editor(s)
Moretto P.Bonnin-Mosbah M.
Document Type
Article
Year published
2001
Published
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X
Volume: 181, Issue: 1-4, Pages: 394-398 (5)
Conference
7Th International Conference on Nuclear Microprobe Technology and Applications, Date: SEP 10-15, 2000, Location: BORDEAUX, FRANCE, Sponsors: CNRS, CEA, CNRS Univ Bordeaux, CNRS Minist Culture & Commun
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Publication Identifiers
SCOPUS: 2-s2.0-0035388395
Wos: WOS:000170885400068
Source Identifiers
ISSN: 0168-583X
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