Structural Studies and Influence of the Structure on the Electrical and Optical Properties of Microcrystalline Silicon Thin Films Produced by Rf Sputtering

AuthID
 P-000-ZGK
3
Author(s)
Adriaenssens, GJ
Document Type
Article
Year published
2000
Published
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 370, Issue: 1-2, Pages: 128-136 (9)
Indexing
Wos®
Scopus®
Crossref®17
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0033690663
Wos: WOS:000087942200021
Source Identifiers
ISSN: 0040-6090
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