Publications

Contour Profiling by Dynamic Ellipse Fitting

AuthID
P-001-2BG

Author(s)

Ciobanu, A

Shahbazkia, H

du Buf, H

Editor(s)

Sanfeliu, A; Villanueva, JJ; Vanrell, M; Alquezar, R; Huang, T; Serra, J

Document Type

Proceedings Paper

Year published

2000

Published

in 15TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION, VOL 3, PROCEEDINGS: IMAGE, SPEECH AND SIGNAL PROCESSING in INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION, ISSN: 1051-4651

Volume: 15, Issue: 3, Pages: 750-753 (4)

Conference

15Th International Conference on Pattern Recognition (Icpr-2000), Date: SEP 03-07, 2000, Location: BARCELONA, SPAIN, Sponsors: Int Assoc Pattern Recognit, Assoc Pattern Recognit & Image Anal, Ctr Visio Comp, Univ Autonoma Barcelona, Univ Politecn Catalunya, Comissionat Universitats Recerca, Generalitat Catalunya Dept Presidencia, Minist Ciencia Tecnol, Fdn Catalana Recerca, HP Invent

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