Publications

Photothermal Characterization of Amorphous Thin Films

AuthID
P-001-3JA

Author(s)

Bein, BK

Bolte, J

Dietzel, D

Daoud, AH

Kalus, G

Macedo, F

Linnenbrugger, A

Bosse, H

Pelzl, J

Document Type

Article

Year published

1999

Published

in SURFACE & COATINGS TECHNOLOGY, ISSN: 0257-8972

Volume: 116, Pages: 147-154 (8)

Conference

6Th International Conference on Plasma Surface Engineering (Pse 98), Date: SEP 14-18, 1998, Location: GARMISCH PARTENKI, GERMANY, Sponsors: European Joint Comm Plasma & Ion Surface Engn

Indexing

Wos^®

Scopus^®

Crossref^®

Google Scholar^®

Metadata
Sources

Publication Identifiers

DOI: 10.1016/s0257-8972(99)00310-2

Scopus: 2-s2.0-18744431229

Wos: WOS:000083914200022

Source Identifiers

ISSN: 0257-8972

Export Publication Metadata

Marked List

Add to Marked List

Info

At this moment we don't have any links to full text documens.

Photothermal Characterization of Amorphous Thin Films

Useful Links

Get Help

Federated Authentication (Click on the image)

Photothermal Characterization of Amorphous Thin Films

Useful Links

Get Help