Temperature Dependence of the First Order Raman Scattering in Thin Films of Mu C-Si : H

AuthID
 P-001-3KS
2
Author(s)
Document Type
Article
Year published
1999
Published
in JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, ISSN: 0924-0136
Volume: 93, Pages: 235-238 (4)
Conference
Proceedings of the 1997 Advances in Materials and Processing Technologies, Ampt'97, Date: 22 July 1997 through 26 July 1997, Location: Guimaraes, Portugal, Sponsors: Junta Nacional de Investigacao Cientifica e Tecnologica;Camara Municipal de Guimaraes;Caixa Geral de Depositos
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Publication Identifiers
SCOPUS: 2-s2.0-0343603505
Wos: WOS:000083218500041
Source Identifiers
ISSN: 0924-0136
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