Temperature Dependence and Annealing Effects on Spin Dependent Tunnel Junctions

AuthID
P-001-4KS
7
Author(s)
Sousa, RC
·
Sun, JJ
·
da Silva, MF
·
Document Type
Article
Year published
1999
Published
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 85, Issue: 8, Pages: 5258-5260 (3)
Conference
43Rd Annual Conference on Magnetism and Magnetic Materials, Date: NOV 09-12, 1998, Location: MIAMI, FL, Sponsors: Amer Inst Phys, IEEE Magnet Soc, Minerals Met Mat Soc, Amer Soc Testing & Mat, Amer Ceramic Soc, Amer Phys Soc, EMTEC Magnet GmbH, Fuji Photo Film Co Ltd, IBM, Imation, Sony corp, TDK Corp, Toda Kogyo Corp, ADE Technol Inc, digital Measurement Syst Div, Komag, MMC Technol Inc
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Publication Identifiers
SCOPUS: 2-s2.0-0032620482
Wos: WOS:000079850700322
Source Identifiers
ISSN: 0021-8979
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