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Cathodoluminescence Study of Gan Epitaxial Layers
AuthID
P-001-D7N
8
Author(s)
Cremades, A
·
Piqueras, J
·
Xavier, C
·
Monteiro, T
·
Pereira, E
·
Meyer, BK
·
Hofmann, DM
·
Fischer, S
Document Type
Article
Year published
1996
Published
in
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,
ISSN: 0921-5107
Volume: 42, Issue: 1-3, Pages: 230-234 (5)
Conference
4Th International Workshop on Beam Injection Assessment of Defects in Semiconductors (Biads 96),
Date:
JUN 03-06, 1996,
Location:
EL ESCORIAL, SPAIN
Indexing
Wos
®
Scopus
®
Crossref
®
24
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®
Metadata
Sources
Publication Identifiers
DOI
:
10.1016/s0921-5107(96)01712-6
Scopus
: 2-s2.0-0001687018
Wos
: WOS:A1996VZ84800040
Source Identifiers
ISSN
: 0921-5107
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