Light Yield and Fano Factor for X-Rays in Xenon Gas Proportional Scintillation Counters

AuthID
 P-001-F56
4
Author(s)
2
Editor(s)
Siegmund, OHW; Gummin, MA
Document Type
Proceedings Paper
Year published
1996
Published
in EUV, X-RAY, AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY VII in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 2808, Pages: 613-616 (4)
Conference
Euv, X-Ray, and Gamma-Ray Instrumentation for Astronomy Vii Conference, Date: AUG 07-09, 1996, Location: DENVER, CO, Sponsors: Soc Photo Opt Instrumentat Engineers, N Amer Remote Sensing Ind Assoc, Amer Soc Photogrammetry & Remote Sensing
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Publication Identifiers
Scopus: 2-s2.0-84887510699
Wos: WOS:A1996BG67M00053
Source Identifiers
ISSN: 0277-786X
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