Publications

Breakdown Voltage Improvement of Standard Mos Technologies Targeted at Smart Power

AuthID
P-001-HQD

Author(s)

Santos, PM

Simas, MIC

Lanca, M

Finco, S

Behrens, FH

Editor(s)

Anon

Document Type

Proceedings Paper

Year published

1995

Published

in IAS '95 - CONFERENCE RECORD OF THE 1995 IEEE INDUSTRY APPLICATIONS CONFERENCE/THIRTIETH IAS ANNUAL MEETING, VOLS 1-3 in IEEE Industry Applications Society Annual Meeting, ISSN: 0197-2618

Volume: 2, Pages: 937-945 (9)

Conference

1995 Ieee Industry Applications Conference/30Th Ias Annual Meeting, Date: OCT 08-12, 1995, Location: LAKE BUENA VISTA, FL, Sponsors: IEEE, Ind Applicat Soc

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