Study of the Structural Properties of Tio2 Films by Scanning Electron Microscopy

AuthID
 P-001-KP9
2
Author(s)
2
Editor(s)
Jouffrey, B; Colliex, C
Document Type
Proceedings Paper
Year published
1994
Published
in ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B: APPLICATIONS IN MATERIALS SCIENCES
Pages: 767-768 (2)
Conference
13Th International Congress on Electron Microscopy, Date: JUL 17-22, 1994, Location: PARIS, FRANCE, Sponsors: Int Federat Soc Electron Microscopy, Minist Enseignement Super & Recher, Acad Sci, Minist Affaires Etrangeres, European Union, CNRS, INSERM, CEA
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Wos®
Publication Identifiers
Wos: WOS:A1994BE09Y00371
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