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Electron-Paramagnetic Resonance Of Defects In Doped Microcrystalline Silicon
AuthID
P-001-T1B
7
Author(s)
LAVADO, M
·
MARTINS, R
·
FERREIRA, I
·
LAVAREDA, G
·
FORTUNATO, E
·
VIEIRA, M
·
GUIMARAES, L
Document Type
Article
Year published
1989
Published
in
VACUUM,
ISSN: 0042-207X
Volume: 39, Issue: 7-8, Pages: 791-794 (4)
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Scopus
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Publication Identifiers
DOI
:
10.1016/0042-207x(89)90039-0
SCOPUS
: 2-s2.0-0024876089
Wos
: WOS:A1989AP86900039
Source Identifiers
ISSN
: 0042-207X
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