Simultaneous Probing of Phase Transformations in Ni-Ti Thin Film Shape Memory Alloy by Synchrotron Radiation-Based X-Ray Diffraction and Electrical Resistivity

AuthID
 P-002-0Q4
6
Author(s)
Baehtz, C
·
von Borany, J
Document Type
Article
Year published
2013
Published
in MATERIALS CHARACTERIZATION, ISSN: 1044-5803
Volume: 76, Pages: 35-38 (4)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84872134234
Wos: WOS:000315366200005
Source Identifiers
ISSN: 1044-5803
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service