Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Radiation Effects in Si-Ge Quantum Size Structure (Review)
AuthID
P-002-0QD
1
Author(s)
Sobolev, NA
Document Type
Article
Year published
2013
Published
in
SEMICONDUCTORS,
ISSN: 1063-7826
Volume: 47, Issue: 2, Pages: 217-227 (11)
Conference
9Th International Conference on Silicon,
Date:
JUL 09-13, 2012,
Location:
St. Petersburg, RUSSIA
Indexing
Wos
®
Scopus
®
Crossref
®
3
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1134/s1063782613020188
Scopus
: 2-s2.0-84874226380
Wos
: WOS:000315166700005
Source Identifiers
ISSN
: 1063-7826
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service