Structural and Electrical Studies of Ultrathin Layers with Si0.7Ge0.3 Nanocrystals Confined in a Sige/Sio2 Superlattice

AuthID
 P-002-A2M
13
Author(s)
Vieira, EMF
·
Martin Sanchez, J
·
Parisini, A
·
Buljan, M
·
Capan, I
·
Bernstorff, S
·
Document Type
Article
Year published
2012
Published
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 111, Issue: 10, Pages: 104323 (9)
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Publication Identifiers
SCOPUS: 2-s2.0-84862142520
Wos: WOS:000305363700149
Source Identifiers
ISSN: 0021-8979
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