Negative Ion Formation Through Dissociative Electron Attachment to Geh4: Comparative Studies with Ch4 and Sih4

AuthID
P-002-N03
6
Author(s)
Hoshino, M
·
Matejcik, S
·
Tanaka, H
Document Type
Article
Year published
2011
Published
in INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, ISSN: 1387-3806
Volume: 306, Issue: 1, Pages: 51-56 (6)
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Publication Identifiers
SCOPUS: 2-s2.0-80051905942
Wos: WOS:000295182700006
Source Identifiers
ISSN: 1387-3806
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