Opto-Electronic Characterization of Electron Traps upon Forming Polymer Oxide Memory Diodes

AuthID
P-002-NPS
8
Author(s)
Bory, BF
·
Verbakel, F
·
De Leeuw, DM
·
Document Type
Article
Year published
2011
Published
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 99, Issue: 8, Pages: 083305 (3)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-80052395014
Wos: WOS:000294359100078
Source Identifiers
ISSN: 0003-6951
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