Publications

Assessment of Doi Resolution in a Fully Mounted Pem Scanner

AuthID
P-002-W7T

Author(s)

Matela, N

Ferreira, CS

Martins, MV

Bugalho, R

Neves, JA

Ortigao, C

Oliveira, N

Varela, J

Almeida, P

Document Type

Proceedings Paper

Year published

2011

Published

in 2011 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC) in IEEE Nuclear Science Symposium Conference Record, ISSN: 1082-3654

Pages: 3351-3353 (3)

Conference

Ieee Nuclear Science Symposium/Medical Imaging Conference (Nss/Mic)/18Th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors, Date: OCT 23-29, 2011, Location: Valencia, SPAIN, Sponsors: IEEE, Inst Elect & Elect Engineers Nucl & Plasma Sci Soc (IEEE NPSS)

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