Tem Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film

AuthID
 P-003-0QQ
5
Author(s)
Document Type
Article
Year published
2010
Published
in MICROSCOPY AND MICROANALYSIS, ISSN: 1431-9276
Volume: 16, Issue: 6, Pages: 662-669 (8)
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Wos®
Scopus®
Crossref®9
Pubmed®
Google Scholar®
Publication Identifiers
Pubmed: 20883600
Scopus: 2-s2.0-79451473169
Wos: WOS:000284715300003
Source Identifiers
ISSN: 1431-9276
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