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Dual-Frequency Sweeping Interferometry for Absolute Metrology of Long Distances
AuthID
P-003-4J7
3
Author(s)
Cabral, A
·
Abreu, M
·
Rebordao, JM
Document Type
Article
Year published
2010
Published
in
OPTICAL ENGINEERING,
ISSN: 0091-3286
Volume: 49, Issue: 8, Pages: 085601 (14)
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Publication Identifiers
DOI
:
10.1117/1.3481105
SCOPUS
: 2-s2.0-80052312098
Wos
: WOS:000281335100015
Source Identifiers
ISSN
: 0091-3286
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