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Raman Study of Stress Effect on Ge Nanocrystals Embedded in Al2O3
AuthID
P-003-4Q0
6
Author(s)
Pinto, SRC
·
Rolo, AG
·
Chahboun, A
·
Kashtiban, RJ
·
Bangert, U
·
Gomes, MJM
Document Type
Article
Year published
2010
Published
in
THIN SOLID FILMS,
ISSN: 0040-6090
Volume: 518, Issue: 19, Pages: 5378-5381 (4)
Indexing
Wos
®
Scopus
®
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®
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Publication Identifiers
DOI
:
10.1016/j.tsf.2010.03.035
Scopus
: 2-s2.0-77955662199
Wos
: WOS:000279885700004
Source Identifiers
ISSN
: 0040-6090
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