Randomized Sample Size F Tests for the One-Way Layout

AuthID
 P-003-C5P
5
Author(s)
Simos, TE
·
2
Editor(s)
Psihoyios, G; Tsitouras, C
Document Type
Proceedings Paper
Year published
2010
Published
in NUMERICAL ANALYSIS AND APPLIED MATHEMATICS, VOLS I-III in AIP Conference Proceedings, ISSN: 0094-243X
Volume: 1281, Pages: 1248-1251 (4)
Conference
International Conference on Numerical Analysis and Applied Mathematics, Date: SEP 19-25, 2010, Location: Rhodes, GREECE, Sponsors: European Soc Comp Methods Sci & Engn
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Publication Identifiers
SCOPUS: 2-s2.0-79954531773
Wos: WOS:000289661500334
Source Identifiers
ISSN: 0094-243X
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