Image Analysis for Crack Detection

AuthID
P-003-DCX
Document Type
Proceedings Paper
Year published
2010
Published
in 2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Pages: 1096-1100 (5)
Conference
International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 03-06, 2010, Location: Austin, TX, Sponsors: IEEE
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-77957831740
Wos: WOS:000287997200210
Source Identifiers
ISSN: 1091-5281
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.