Induction Defectoscope Based on Uniform Eddy Current Probe with Gmrs

AuthID
 P-003-DCZ
3
Author(s)
Document Type
Proceedings Paper
Year published
2010
Published
in 2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Pages: 1278-1283 (6)
Conference
International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 03-06, 2010, Location: Austin, TX, Sponsors: IEEE
Indexing
Wos®
Scopus®
Crossref®3
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-77957832064
Wos: WOS:000287997200243
Source Identifiers
ISSN: 1091-5281
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service