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Photopeak Shift Effects Due to the Drift Electric Field in High Pressure Xenon Detectors
AuthID
P-003-DDW
6
Author(s)
Neves, PNB
·
Barata, JAS
·
Tavora, LMN
·
Dias, THVT
·
Borges, FIGM
·
Conde, CAN
Document Type
Proceedings Paper
Year published
2010
Published
in
2010 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD (NSS/MIC)
in
IEEE Nuclear Science Symposium Conference Record,
ISSN: 1082-3654
Pages: 1472-1473 (2)
Conference
Ieee Nuclear Science Symposium (Nss)/Medical Imaging Conference (Mic)/17Th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors,
Date:
OCT 30-NOV 06, 2010,
Location:
Knoxville, TN,
Sponsors:
Inst Elect & Elect Engineers, Nucl & Plasma Sci Soc, IEEE
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®
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Metadata
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Publication Identifiers
DOI
:
10.1109/nssmic.2010.5874017
Scopus
: 2-s2.0-79960298075
Wos
: WOS:000306402901135
Source Identifiers
ISSN
: 1082-3654
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