Coexistence of Universal and Topological Anomalous Hall Effects in Metal Cro2 Thin Films in the Dirty Limit

AuthID
 P-003-J91
11
Author(s)
Branford, WR
·
Yates, KA
·
Barkhoudarov, E
·
Moore, JD
·
Morrison, K
·
Miyoshi, Y
·
Cohen, LF
Document Type
Article
Year published
2009
Published
in PHYSICAL REVIEW LETTERS, ISSN: 0031-9007
Volume: 102, Issue: 22
Indexing
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Publication Identifiers
Pubmed: 19658897
SCOPUS: 2-s2.0-66749147266
Wos: WOS:000266685400053
Source Identifiers
ISSN: 0031-9007
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