Yarn Parameterization Correlation Using Optical and Capacitive Sensors Approaches

AuthID
 P-003-QF6
4
Author(s)
Document Type
Proceedings Paper
Year published
2009
Published
in IECON: 2009 35TH ANNUAL CONFERENCE OF IEEE INDUSTRIAL ELECTRONICS, VOLS 1-6
Pages: 1828-1833 (6)
Conference
35Th Annual Conference of the Ieee-Industrial-Electronics-Society (Iecon 2009), Date: NOV 03-05, 2009, Location: Porto, PORTUGAL, Sponsors: IEEE Ind Elect Soc
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Publication Identifiers
SCOPUS: 2-s2.0-77951573357
Wos: WOS:000280762000309
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