Charge Injection/Extraction at a Metal-Dielectric Interface: Experimental Validation

AuthID
P-003-QGE
2
Author(s)
Document Type
Article
Year published
2009
Published
in IEEE ELECTRICAL INSULATION MAGAZINE, ISSN: 0883-7554
Volume: 25, Issue: 1, Pages: 15-22 (8)
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Publication Identifiers
SCOPUS: 2-s2.0-63249129479
Wos: WOS:000262933600004
Source Identifiers
ISSN: 0883-7554
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