Spatially-Resolved Photocapacitance Measurements to Study Defects in A-Si : H Based P-I-N Particle Detectors

AuthID
 P-003-YKJ
11
Author(s)
Casteleiro, C
·
Wuensch, F
·
Kunst, M
·
Document Type
Article
Year published
2008
Published
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 516, Issue: 15, Pages: 5118-5121 (4)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-43049086627
Wos: WOS:000256509100075
Source Identifiers
ISSN: 0040-6090
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service