Radiation Hardness of Gesi Heterostructures with Thin Ge Layers

AuthID
P-004-1GM
12
Author(s)
Santos, NM
·
Sobolev, NA
·
Stepina, NP
·
Carmo, MC
·
Magalhaes, S
·
Novikov, AV
·
Shaleev, MV
·
Lobanov, DN
·
Krasilnik, ZF
Document Type
Article
Year published
2008
Published
in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, ISSN: 0921-5107
Volume: 147, Issue: 2-3, Pages: 191-194 (4)
Conference
Symposium on Semiconductor Nanostructures Towards Electronic and Optoelectronic Device Applications Held at the 2007 Emrs Spring Meeting, Date: MAY 28-JUN 01, 2007, Location: Strasbourg, FRANCE
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Publication Identifiers
Scopus: 2-s2.0-38749151931
Wos: WOS:000253798300020
Source Identifiers
ISSN: 0921-5107
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