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Optical and Microstructural Investigations of Porous Silicon Coated with A-Si:h Using Pecvd Technique

AuthID
P-004-27R

Author(s)

Prabakaran, R

Elangovan, E

Editor(s)

Marques,AT;Silva,AF;Baptista,APM;Sa,C;Alves,FJLA;Malheiros,LF;Vieira,M

Document Type

Proceedings Paper

Year published

2008

Published

in ADVANCED MATERIALS FORUM IV in Materials Science Forum, ISSN: 0255-5476

Volume: 587-588, Pages: 308-312 (5)

Conference

13Th Conference of the Sociedade-Portuguesa-De-Materiais/4Th International Materials Symposium, Date: APR 01-04, 2007, Location: Oporto, PORTUGAL

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Publication Identifiers

DOI: 10.4028/www.scientific.net/msf.587-588.308

SCOPUS: 2-s2.0-60349088150

Wos: WOS:000259898200062

Source Identifiers

ISSN: 0255-5476

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Optical and Microstructural Investigations of Porous Silicon Coated with A-Si:h Using Pecvd Technique

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