Inductive Probe for Flaw Detection in Non-Magnetic Metallic Plates Using Eddy Currents

AuthID
 P-004-5A1
2
Author(s)
Document Type
Proceedings Paper
Year published
2008
Published
in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 in IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, PROCEEDINGS, ISSN: 1091-5281
Pages: 1447-1451 (5)
Conference
25Th Ieee Instrumentation and Measurement Technology Conference, Date: MAY 12-15, 2008, Location: Victoria, CANADA, Sponsors: IEEE Instrumentat & Measurement Soc
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Publication Identifiers
SCOPUS: 2-s2.0-51349169572
Wos: WOS:000261512101022
Source Identifiers
ISSN: 1091-5281
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