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Refinement of the Layered Titanosilicate Am-1 from Single-Crystal X-Ray Diffraction Data
AuthID
P-004-6BN
6
Author(s)
Ferdov, S
·
Kolitsch, U
·
Lengauer, C
·
Tillmanns, E
·
Lin, Z
·
Ferreira, RAS
Document Type
Article
Year published
2007
Published
in
ACTA CRYSTALLOGRAPHICA SECTION E-STRUCTURE REPORTS ONLINE,
ISSN: 1600-5368
Volume: 63, Issue: 11, Pages: I186-U20 (11)
Indexing
Wos
®
Scopus
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Publication Identifiers
DOI
:
10.1107/s160053680704812x
SCOPUS
: 2-s2.0-35948987543
Wos
: WOS:000251281800002
Source Identifiers
ISSN
: 1600-5368
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