The Histogram Test of Adcs Is Unbiased by Phase Noise

AuthID
 P-004-R1W
2
Author(s)
Document Type
Proceedings Paper
Year published
2006
Published
in 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5 in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Pages: 1639-1642 (4)
Conference
23Rd Ieee Instrumentation and Measurement Technology Conference, Date: APR 24-27, 2006, Location: Sorrento, ITALY, Sponsors: IEEE Instrumentat & Measurement Soc
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Publication Identifiers
Wos: WOS:000244176703035
Source Identifiers
ISSN: 1091-5281
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