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Grace Ontology Integrating Process and Quality Control
AuthID
P-005-41Y
5
Author(s)
Leitao, P
·
Rodrigues, N
·
Turrin, C
·
Pagani, A
·
Petrali, P
Document Type
Proceedings Paper
Year published
2012
Published
in
38TH ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS SOCIETY (IECON 2012)
in
IEEE Industrial Electronics Society,
ISSN: 1553-572X
Pages: 4348-4353 (6)
Conference
38Th Annual Conference on Ieee-Industrial-Electronics-Society (Iecon ),
Date:
OCT 25-28, 2012,
Location:
Montreal, CANADA,
Sponsors:
IEEE, IEEE Ind Elect Soc (IES),
Host:
Univ Quebec, Ecole Technologie Superieure Montreal (ETS)
Indexing
Wos
®
Scopus
®
Crossref
®
7
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1109/iecon.2012.6389189
SCOPUS
: 2-s2.0-84872921006
Wos
: WOS:000316962904048
Source Identifiers
ISSN
: 1553-572X
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