Sub-Micron Structuring of Silicon Using Femtosecond Laser Interferometry

AuthID
 P-006-656
6
Author(s)
Document Type
Article
Year published
2013
Published
in OPTICS AND LASER TECHNOLOGY, ISSN: 0030-3992
Volume: 54, Pages: 428-431 (4)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-84880882551
Wos: WOS:000323992900064
Source Identifiers
ISSN: 0030-3992
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service