Architecture of Test Support Ics for Mixed-Signal Testing

AuthID
 P-007-6DK
4
Author(s)
Matos Jose, S
·
Leao Ana, C
·
1
Editor(s)
Anon
Document Type
Proceedings Paper
Year published
1994
Published
in Proceedings of the IEEE VLSI Test Symposium
Pages: 240-246
Conference
Proceedings of the 12Th Ieee Vlsi Test Symposium, Date: 25 April 1994 through 28 April 1994, Location: Cherry Hill, NJ, USA, Sponsors: IEEE Computer Society;IEEE Philadelphia Section
Indexing
Scopus®
Publication Identifiers
Scopus: 2-s2.0-0028734870
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service