In Situ Thickness Measurements of Ultra-Thin Multilayer Polymer Films by Atomic Force Microscopy

AuthID
 P-007-8S4
7
Author(s)
Pereira-da-Silva, MA
·
Faria, RM
·
Pereira-da-Silva, MA
·
Faria, RM
Document Type
Article
Year published
1999
Published
in NANOTECHNOLOGY, ISSN: 0957-4484
Volume: 10, Issue: 4, Pages: 389-393 (5)
Indexing
Wos®
Scopus®
Crossref®68
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0033341347
Wos: WOS:000084337900005
Source Identifiers
ISSN: 0957-4484
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