Low-Temperature Properties of Compensated Ge Films Used for Cryogenic Thermometers

AuthID
P-007-A83
4
Author(s)
Mitin, VF
·
Kholevchuk, VV
·
5
Editor(s)
Ashok, S; Chevallier, J; Johnson, NM; Sopori, BL; Okushi, H
Document Type
Proceedings Paper
Year published
2002
Published
in DEFECT AND IMPURITY ENGINEERED SEMICONDUCTORS AND DEVICES III in MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, ISSN: 0272-9172
Volume: 719, Pages: 445-450 (6)
Conference
Symposium on Defect and Impurity Engineered Semiconductors and Devices Iii Held at the 2002 Mrs Spring Meeting, Date: APR 01-05, 2002, Location: SAN FRANCISCO, CA, Sponsors: Mat Res Soc
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Publication Identifiers
Scopus: 2-s2.0-0036447847
Wos: WOS:000178622200066
Source Identifiers
ISSN: 0272-9172
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