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Extended X-Ray Absorption Fine Structure Studies of Thulium Doped Gan Epilayers
AuthID
P-007-C1M
12
Author(s)
Katchkanov, V
·
Mosselmans, JFW
·
Dalmasso, S
·
O'Donnell, KP
·
Hernandez, S
·
Wang, K
·
Martin, RW
·
Briot, O
·
Rousseau, N
·
Halambalakis, G
·
Lorenz, K
·
Alves, E
1
Editor(s)
Briot O.Butcher K.S.Gil B.Wetzel C.Yoshikawa A.
Document Type
Article
Year published
2004
Published
in
Superlattices and Microstructures,
ISSN: 0749-6036
Volume: 36, Issue: 4-6, Pages: 729-736
Conference
European Materials Research Society 2004, Symposium L. Inn,
Date:
24 May 2004 through 28 May 2004,
Location:
Strasbourg
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®
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Metadata
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Publication Identifiers
DOI
:
10.1016/j.spmi.2004.09.029
Scopus
: 2-s2.0-10044293362
Source Identifiers
ISSN
: 0749-6036
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