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Sensitivity of a Rotating Beam Sensor for Stress Evaluation in Aluminium Thin Films

AuthID
P-007-JHW

Author(s)

Dos Santos, JMM

Pina, JCP

Batista, AC

Horsfall, AB

Wang, K

Wright, NG

Soare, SM

Bull, SJ

O'Neill, AG

Terry, JG

Walton, AJ

Gundlach, AM

Stevenson, JTM

Document Type

Proceedings Paper

Year published

2005

Published

in Materials Science Forum, ISSN: 0255-5476

Volume: 490-491, Pages: 649-654

Conference

7Th International Conference on Residual Stresses, Icrs-7, Date: 14 June 2004 through 17 June 2004, Location: Xi'an, Sponsors: XI'AN Jiaotong University

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Publication Identifiers

DOI: 10.4028/www.scientific.net/msf.490-491.649

SCOPUS: 2-s2.0-35148822702

Source Identifiers

ISSN: 0255-5476

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Sensitivity of a Rotating Beam Sensor for Stress Evaluation in Aluminium Thin Films

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