Interstitial Carbon-Related Defects in Si1-Xgex Alloys

AuthID
P-007-KBN
10
Author(s)
Khirunenko, LI
·
Sosnin, MG
·
Abrosimov, NV
·
Riemann, H
Document Type
Proceedings Paper
Year published
2008
Published
in Diffusion and Defect Data Pt.B: Solid State Phenomena, ISSN: 1012-0394
Volume: 131-133, Pages: 59-64
Conference
12Th International Autumn Meeting: Gettering and Defect Engineering in Semiconductor Technology, Gadest 2007, Date: 14 October 2007 through 19 October 2007, Location: Erice, Sponsors: Solar World AG-Deutsche Cell GmbH;Deutsche Solar AG;European-MRS;MEMC-Electronic Materials;Trans Tech Publications
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Publication Identifiers
SCOPUS: 2-s2.0-38749111159
Source Identifiers
ISSN: 1012-0394
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