The Barrier Height for Electron Injection/Extraction at Metal-Dielectric Interface

AuthID
 P-007-QDS
5
Author(s)
Neagu, RM
·
Document Type
Proceedings Paper
Year published
2008
Published
in Proceedings - International Symposium on Electrets
Conference
13Th International Symposium on Electrets, Ise 13, Date: 15 September 2008 through 17 September 2008, Location: Tokyo
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Publication Identifiers
SCOPUS: 2-s2.0-67649553624
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