Characterisation of Iii-Nitride Materials by Synchrotron X-Ray Microdiffraction Reciprocal Space Mapping

AuthID
 P-008-9VK
10
Author(s)
Dolbnya, I
·
O'Donnell, K
·
Sadler, T
·
Li, HN
·
2
Editor(s)
Toropov, A; Ivanov, S
Document Type
Proceedings Paper
Year published
2013
Published
in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 3 in Physica Status Solidi C-Current Topics in Solid State Physics, ISSN: 1862-6351
Volume: 10, Issue: 3, Pages: 481-485 (5)
Conference
4Th International Symposium on Growth of Iii-Nitrides (Isgn), Date: JUL 16-19, 2012, Location: Saint-Petersburg, RUSSIA, Sponsors: Russian Acad Sci, Ioffe Phys-Tech Inst, Riber, Aixtron, Komef, U S Army Foward Element Commmand Atlantic, Off Naval Res Sci & Technol, SemiTEq, Veeco, Optogan LED Solut, Crystal IS
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84874986523
Wos: WOS:000317290800050
Source Identifiers
ISSN: 1862-6351
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service