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Experimental Investigation of the Influence of Electron Incidence Angle on the Total Electron Emission Yield of Silver

AuthID
P-008-DJA

Author(s)

Gineste, T

Belhaj, M

Bundaleski, N

Teodoro, OMND

Pons, C

Puech, J

Balcon, N

Document Type

Proceedings Paper

Year published

2013

Published

in 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings

Conference

14Th Ieee International Vacuum Electronics Conference, Ivec 2013, Date: 21 May 2013 through 23 May 2013, Location: Paris, Sponsors: THALES;CBL Ceramics Ltd.;CST

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Publication Identifiers

DOI: 10.1109/ivec.2013.6571182

SCOPUS: 2-s2.0-84883319490

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Experimental Investigation of the Influence of Electron Incidence Angle on the Total Electron Emission Yield of Silver

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Experimental Investigation of the Influence of Electron Incidence Angle on the Total Electron Emission Yield of Silver

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