Publications

AuthID
P-008-KX4

Author(s)

Cejudo, JMC

García, MB

Bueno, RM

Bifet, A

Editor(s)

Tom Diethe; José L. Balcázar; John Shawe-Taylor; Cristina Tîrnauca

Document Type

Proceedings Paper

Year published

2011

Published

in Proceedings of the Second Workshop on Applications of Pattern Analysis, WAPA 2011, Castro Urdiales, Spain, October 19-21, 2011 in JMLR Proceedings

Volume: 17, Pages: 12-18

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Publication Identifiers

DBLP: journals/jmlr/Carmona-CejudoBBGB11

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