Publications

Comparison of Diffusion Length Measurements from the Flying Spot Technique and the Photocarrier Grating Method in Amorphous Thin Films

AuthID
P-008-R1N

Author(s)

Vieira, M

Fantoni, A

Martins, R

Koynov, S

Wang, F

Grebner, S

Schwarz, R

Editor(s)

Anon

Document Type

Proceedings Paper

Year published

1994

Published

in Conference Record of the IEEE Photovoltaic Specialists Conference, ISSN: 0160-8371

Volume: 1, Pages: 575-578

Conference

Proceedings of the 24Th Ieee Photovoltaic Specialists Conference. Part 2 (Of 2), Date: 5 December 1994 through 9 December 1994, Location: Waikoloa, HI, USA, Sponsors: IEEE Electron Devices Society

Indexing

Scopus^®

Metadata
Sources

Publication Identifiers

Scopus: 2-s2.0-0028693517

Source Identifiers

ISSN: 0160-8371

Export Publication Metadata

Marked List

Add to Marked List

Info

At this moment we don't have any links to full text documens.

Comparison of Diffusion Length Measurements from the Flying Spot Technique and the Photocarrier Grating Method in Amorphous Thin Films

Useful Links

Get Help

Federated Authentication (Click on the image)

Comparison of Diffusion Length Measurements from the Flying Spot Technique and the Photocarrier Grating Method in Amorphous Thin Films

Useful Links

Get Help